Materials Characterization


Materials are studied using a range of tools including microscopes, thermomechanical analyzers, and a vector network analyzer.



Polymer Analysis

 

The hardness of rubber, plastic, and other non-metallic materials can be measured with a durometer. The test is nondestructive and does not require elaborate specimen preparation, which makes it an ideal method for checking materials under any condition with accuracy and reliability.

 

Rex Gauge Model DD-4 Digital Durometers
  • ASTM Type A (soft rubber, plastics, and elastomers)
  • ASTM Type D (harder rubber, plastics, and thermoplastics)

 

 

Composite Analysis

 

Composite fiber volume fractions can be measured using chemical removal of the polymer matrix or burning off the matrix with a high temperature muffle furnace.

 

Barnstead Thermolyne 48000 Furnace

  • Temperature operating range of 1093°C (continuous) and 1200°C (intermittent)


 

Microscopy Facility

 

CEAM has several optical microscopes for inspection of samples, as well as access to scanning electron microscopes (SEM) and atomic force microscopy (AFM) at the Nano3 facility at Calit2.


  • Nikon Optical 50-1000x
  • Stereo Vision and Photo Capabilities
  • Dinolite USB microscope model AM-4013 MT 25-255x
  • Computer interface and digital measurement
  • Mitutoyo TM-500
  • Two axis digital stage

Microscopes





Thermal Analysis

 

CEAM has two DMAs and one DSC for characterizing thermal and mechanical properties over a wide range of temperatures.  Typically, DSC is used to study the chemistry of polymers, including reaction kinetics.  DMA results are often used to create master curves for polymers.

 

TA Instruments 2980 Dynamic Mechanical Analyzer (DMA)

  • -145°C to 600°C
  • 0.01 Hz to 200 Hz
  • 18 N max force

     

Bose Electroforce 3200 Dynamic Mechanical Analyzer (DMA)

  • -184°C to 315°C
  • 0 Hz to 200 Hz
  • 450 N max force

 

TA Instruments 2920 Differential Scanning Calorimeter (DSC)

  • -145°C to 600°C
  • Temperature modulation

 

 


DMA and DSC



 

Ultrasonic Characterization

 

CEAM has several ultrasonic characterization stations.

 

Transducers

  • Olympus Panametrics
  • Longitudinal and shear
  • 500 kHz - 5 MHz

     

Oscilloscopes

  • Tektronix DPO 3014

 

Signal generators

  • Agilent 33220A

 

Amplifiers

  • Piezosystems Inc. EPA-104 0 – 250 kHz
  • Ritec GA-2500A 250 kHz - 5 MHz

 

Temperature chamber

  • Sun Electronics System model ET1-2
  • -184°C to 315°C

 

 

Electromagnetic Characterization

 

An Agilent vector network analyzer enables full S-parameter electromagnetic characterization from 5 - 40 GHz.  The system is setup to create and measure focused beams or free space plane waves.

 



EM setup


 

Velmex 3D Scanner

  • 2' x 2' x 4' volume
  • Computer controlled

 

 

 

High-Pressure Characterization

 

CEAM has a set of devices for high-pressure research up to 20GPa.

 

Diamond Anvil Cell

  • Type 1a Bragg-LT (G) Plus, Almaz EasyLab Inc. London
  • Diameter of culet: 700 micron
  • Maximum pressure: 20GPa

 

 

Optiprexx Ruby Lux System

  • Ruby photoluminescence measurement
  • Spectrometer with a green laser (532nm @10mW)

 

 

Diacell iGM Controller with a guick-release Swagelok coupling

  • Automated gas membrane controller

 

 

high pressure setup

 

 



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